Deep learning wavefront sensing
Yohei Nishizaki(The University of Osaka), Matias Valdivia(Pontificia Universidad Católica de Valparaíso), Ryoichi Horisaki(The University of Osaka), Katsuhisa Kitaguchi(Osaka Research Institute of Industrial Science and Technology), Mamoru Saito(Osaka Research Institute of Industrial Science and Technology), Jun Tanida(The University of Osaka), Esteban Vera(Pontificia Universidad Católica de Valparaíso)
Cited by 246Open Access
Abstract
We present a new class of wavefront sensors by extending their design space based on machine learning. This approach simplifies both the optical hardware and image processing in wavefront sensing. We experimentally demonstrated a variety of image-based wavefront sensing architectures that can directly estimate Zernike coefficients of aberrated wavefronts from a single intensity image by using a convolutional neural network. We also demonstrated that the proposed deep learning wavefront sensor can be trained to estimate wavefront aberrations stimulated by a point source and even extended sources.
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