Comparison CCEM-K4.2017 of 10 pF and 100 pF capacitance standards
P. Gournay(Bureau international des poids et mesures), Y. P. Semenov(D.I. Mendeleyev Institute for Metrology), Ruizhen Xie(National Measurement Institute), Y Wang, J H Belliss(Middlesex University), Lezheng Huang(National Institute of Metrology), J. Schurr(Physikalisch-Technische Bundesanstalt), J Lee(Physikalisch-Technische Bundesanstalt), R Chayramy(Bureau international des poids et mesures), Yue Yang(Chengde Medical University), Leigh Johnson(National Measurement Institute), S. P. Giblin(Middlesex University), Benjamin Rolland(Bureau international des poids et mesures), Brett F. Thornton(Middlesex University), Andrew D. Koffman, F. Overney(Swiss Federal Institute of Metrology), Zhiyi Lu(Stanford University)
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