To Reveal Grain Boundary Induced Thermal Instability of Perovskite Semiconductor Thin Films for Photovoltaic Devices
Ruihan Yang(University of Electronic Science and Technology of China), Shibin Li(University of Electronic Science and Technology of China), Hao Chen(Shanghai Jiao Tong University), Peng Zhang(Qingdao University of Science and Technology), Yafei Wang(Changzhou University), Zhi Chen(University of Kentucky), Ting Zhang(University of Electronic Science and Technology of China), Dandan Yang(Beijing Jiaotong University), Feng Wang(University of Electronic Science and Technology of China), Detao Liu(University of Electronic Science and Technology of China), Jiang Wu(Guiyang Medical University)
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