To Reveal Grain Boundary Induced Thermal Instability of Perovskite Semiconductor Thin Films for Photovoltaic Devices

Ruihan Yang(University of Electronic Science and Technology of China), Shibin Li(University of Electronic Science and Technology of China), Hao Chen(Northwestern University), Peng Zhang(University of Electronic Science and Technology of China), Yafei Wang(University of Electronic Science and Technology of China), Zhi Chen(University of Kentucky), Ting Zhang(University of Electronic Science and Technology of China), Dandan Yang(Beijing Jiaotong University), Feng Wang(University of Electronic Science and Technology of China), Detao Liu(University of Electronic Science and Technology of China), Jiang Wu(University College London)
IEEE Journal of Photovoltaics
October 31, 2018
Cited by 17


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