Investigation of the optical and electrical parameters of As47.5Se47.5Ag5 thin films with different thicknesses for optoelectronic applications

Mansour Mohamed(University of Ha'il), M.A. Abdel-Rahim(Assiut University), Safwat A. Mahmoud(Northern Border University), E.R. Shaaban(Al-Azhar University), A.Y. Abdel-Latief(Assiut University), Mohamed N. Abd‐el Salam(Higher Institute of Engineering)
Optik
October 18, 2018
Cited by 67


Related Papers