Residual gas effect in LEBT on transverse emittance of multiply charged heavy ion beams extracted from ECR ion source

T. Nagatomo(RIKEN Nishina Center), O. Kamigaito(Nippon Soken (Japan)), J. P. Mira(iThemba Laboratory), Vasilis Tzoganis(University of Liverpool), T. Nakagawa(RIKEN Nishina Center)

AIP conference proceedings

January 1, 2018

10.1063/1.5053359

Cited by 1

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