Genome-wide linkage mapping of yield-related traits in three Chinese bread wheat populations using high-density SNP markers

Faji Li(Xinjiang Agricultural University), Xianchun Xia(Chinese Academy of Agricultural Sciences), Jindong Liu(Chinese Academy of Agricultural Sciences), Jun Yan(Chinese Academy of Agricultural Sciences), Pingzhi Zhang(Anhui Academy of Agricultural Sciences), Zhonghu He(Central University of Finance and Economics), Yingxiu Wan(Anhui Academy of Agricultural Sciences), Hui Jin(Chinese Academy of Agricultural Sciences), Hongwei Geng(Beihang University), Weie Wen(Chinese Academy of Agricultural Sciences), Shuanghe Cao(Chinese Academy of Agricultural Sciences)
Theoretical and Applied Genetics
June 1, 2018
10.1007/s00122-018-3122-6
Cited by 208

Related Papers

Aegilops tauschii draft genome sequence reveals a gene repertoire for wheat adaptation
|Nature|2013|742
Crop Breeding Chips and Genotyping Platforms: Progress, Challenges, and Perspectives
|Molecular Plant|2017|553
Development and validation of KASP assays for genes underpinning key economic traits in bread wheat
|Theoretical and Applied Genetics|2016|546
Wheat Stripe Rust Epidemic and Virulence of <i>Puccinia striiformis</i> f. sp. <i>tritici</i> in China in 2002
|Plant Disease|2004|388
A rapid monitoring of NDVI across the wheat growth cycle for grain yield prediction using a multi-spectral UAV platform
|Plant Science|2018|381