Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs
Seiya Manabe(Kyushu University), Yasuhiro Miyake(High Energy Accelerator Research Organization), M. Tampo(Kansai Institute for Photon Science), Wang Liao(The University of Osaka), Keita Nakano(Kyushu University), Tadahiro Kin(Kyushu University), Shinichiro Abe(Japan Atomic Energy Agency), Hikaru Sato(Akita University), Masanori Hashimoto(The University of Osaka), Koji Hamada(National Defense Medical College), Yukinobu Watanabe(Kyushu University)
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