Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs

Wang Liao(The University of Osaka), Yasuhiro Miyake(High Energy Accelerator Research Organization), Yukinobu Watanabe(Kyushu University), M. Tampo(Kansai Institute for Photon Science), Keita Nakano(Kyushu University), Tadahiro Kin(Kyushu University), Shinichiro Abe(Japan Atomic Energy Agency), Hikaru Sato(Akita University), Masanori Hashimoto(The University of Osaka), Koji Hamada(National Defense Medical College), Seiya Manabe(Kyushu University)
IEEE Transactions on Nuclear Science
April 11, 2018
Cited by 29


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