Role of plasma-induced defects in the generation of 1/<i>f</i> noise in graphene

Alessandro Cultrera(Istituto Nazionale di Ricerca Metrologica), Giampiero Amato(Istituto Nazionale di Ricerca Metrologica)
Applied Physics Letters
February 26, 2018
10.1063/1.5024218
Cited by 6

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