Cross-Project and Within-Project Semisupervised Software Defect Prediction: A Unified Approach

Fei Wu(Nanjing University of Posts and Telecommunications), Yanfei Sun(Nanjing University of Information Science and Technology), Fangyi Cui(Nanjing University of Posts and Telecommunications), Xiao‐Yuan Jing(Nanjing University of Posts and Telecommunications), Jing Sun(Nanjing University of Posts and Telecommunications), Lin Huang(Nanjing University of Posts and Telecommunications), Ying Sun(Nanjing University of Posts and Telecommunications)
IEEE Transactions on Reliability
March 21, 2018
Cited by 140


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