Suppression of runaway electrons by mode locking during disruptions on J-TEXT
Zhongyong Chen(Huazhong University of Science and Technology), Li Gao(State Key Laboratory of Advanced Electromagnetic Engineering and Technology), Zhoujun Yang(Huazhong University of Science and Technology), Long Zeng(Shangrao Normal University), Zheng Wang(Tianjin University of Science and Technology), Yonghua Ding(Huazhong University of Science and Technology), Ruihai Tong(Southwestern Institute of Physics), Y. Pan(Hunan University), Qiming Hu(Princeton Plasma Physics Laboratory), Dan Huang(Hohai University), Y. Liang(Forschungszentrum Jülich), Zhifang Lin(Huazhong University of Science and Technology), Ye Dong(Southwestern Institute of Physics), Zhonghe Jiang(Huazhong University of Science and Technology), Ming Zhang(National Engineering Research Center of Electromagnetic Radiation Control Materials), Bo Rao(Wuhan University), G. Zhuang(University of Science and Technology of China), Y N Wei(Huazhong University of Science and Technology), X.Q. Zhang(Huazhong University of Science and Technology), W. Yan(Huazhong University of Science and Technology), A.J. Dai(Huazhong University of Science and Technology)
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