Thermal Stability of HfO<sub>x</sub>-Based Resistive Memory Array: A Temperature Coefficient Study

Xiao Hu Wang(Institute of Microelectronics), He Qian(University of Science and Technology of China), Bin Gao(Chinese Academy of Sciences), Ning Deng(Fujitsu (China)), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Xinyi Li(Institute of Microelectronics)
IEEE Electron Device Letters
December 25, 2017
10.1109/led.2017.2787124
Cited by 18

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