Digital Holography, a metrological tool for quantitative analysis: Trends and future applications
Melania Paturzo(Institute of Applied Science and Intelligent Systems), Pietro Ferraro(National Research Council), Lisa Miccio(Institute of Applied Science and Intelligent Systems), Vito Pagliarulo(Institute of Applied Science and Intelligent Systems), Vittorio Bianco(Institute of Applied Science and Intelligent Systems), Pasquale Memmolo(Institute of Applied Science and Intelligent Systems), Francesco Merola(Institute of Applied Science and Intelligent Systems)
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