Digital Holography, a metrological tool for quantitative analysis: Trends and future applications
Melania Paturzo(Institute of Applied Science and Intelligent Systems), Pietro Ferraro(TomTom (Netherlands)), Lisa Miccio(National Institute of Optics), Vito Pagliarulo(Institute of Applied Science and Intelligent Systems), Vittorio Bianco(Institute of Applied Science and Intelligent Systems), Pasquale Memmolo(Institute of Applied Science and Intelligent Systems), Francesco Merola(Institute of Applied Science and Intelligent Systems)
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