An improved kernel exponential discriminant analysis for fault identification of batch process

Ruixuan Wang(Beijing University of Chemical Technology), Haiyan Wu(Beijing University of Chemical Technology), Jinglin Zhou(Beijing University of Chemical Technology), Jing Wang(Beijing Academy of Artificial Intelligence)
2017 6th Data Driven Control and Learning Systems (DDCLS)
May 1, 2017
10.1109/ddcls.2017.8067718
Cited by 1

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