Coordinated <scp>EDX</scp> and micro‐Raman analysis of presolar silicon carbide: A novel, nondestructive method to identify rare subgroup SiC
Jianhua Wang(Qujing Normal University), A. Steele(Planetary Science Institute), B. T. De Gregorio(Carnegie Institution for Science), R. M. Stroud(University of California, San Francisco), L. R. Nittler(Arizona State University), C. M. O'd. Alexander(Carnegie Institution for Science)
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