Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor
J.P. Hou, Zhen Zhang, Qing-xin CHEN(Zhejiang Institute of Special Equipment Inspection), R. Li(Zhejiang Institute of Special Equipment Inspection), Z.J. Zhang(Chinese Academy of Sciences), Xiaowu Li(Chinese Academy of Sciences), Huashun Yu(Zhejiang Institute of Special Equipment Inspection)
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