Grain boundary scattering effects on mobilities in p-type polycrystalline SnSe
Si Wang(University of Electronic Science and Technology of China), Ctirad Uher(University of Michigan–Ann Arbor), Trevor P. Bailey(University of Michigan), Si Hui(University of Michigan), Xiaoyuan Zhou(Central South University), Xinfeng Tang(Wuhan University of Technology), Kunling Peng(Nanjing University of Science and Technology)
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