4H-SiC MOS interface states studied by electron spin resonance spectroscopy

T. Umeda(The University of Tokyo), Takeshi Ohshima, Shinsuke Harada, Ryoji Kosugi, Ryoji Arai, T. Makino(University of Fukui), Y. Satoh, Hajime Okumura(bioMérieux (United States)), Mitsuo Okamoto

IEICE Technical Report; IEICE Tech. Rep.

June 11, 2013

Cited by 0

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