Microstructure and electrical properties of ferroelectric Bi3.15Nd0.85Ti3O12/BiFeO3/Bi3.15Nd0.85Ti3O12 trilayered thin films on Pt/Ti/SiO2/Si

Hongyan Qi(Hubei University of Education), Ming Xiao(University of Akron), Yu Tang(Hubei University of Education), Huaixin Wang(Thomas Jefferson University), Xiaojun Xu(Hubei University of Education), Pengcheng Xiao(Hubei University of Education)
Journal of Materials Science Materials in Electronics
June 2, 2017
Cited by 4


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