Impact of Temporal Masking of Flip-Flop Upsets on Soft Error Rates of Sequential Circuits
Rongmei Chen(Tsinghua University), Dan Fleetwood(Vanderbilt University), Yanran P. Chen(Vanderbilt University), Z. J. Diggins(Vanderbilt University), En Xia Zhang(Vanderbilt University), Balaji Narasimham(Broadcom (United States)), B. L. Bhuva(Vanderbilt University), Yi Liu(Donghua University), Liang Wang(Beijing Microelectronics Technology Institute), N. N. Mahatme, Arthur F. Witulski(Vanderbilt University)
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