Impurity screening behavior of the high-field side scrape-off layer in near-double-null configurations: prospect for mitigating plasma–material interactions on RF actuators and first-wall components
B. LaBombard(Fusion (United States)), S.J. Wukitch(Fusion (United States)), A.Q. Kuang(Boston Fusion (United States)), J. W. Hughes(Fusion (United States)), I. Faust(Fusion (United States)), P. Rodriguez-Fernandez(Fusion (United States)), Mark Chilenski(Fusion (United States)), D. Brunner(Boston Fusion (United States)), M.L. Reinke(Oak Ridge National Laboratory), G. M. Wallace, N. T. Howard(Vanderbilt University), S. Wolfe(Fusion (United States)), R. Mumgaard, D.G. Whyte(Fusion (United States)), J. Terry(Fusion (United States)), J. E. Rice(University of Michigan), E. Marmar(Plasma Technology (United States)), Y. Lin(Fusion (United States))
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