Measurement of APT using a combined CERT-AREX approach with varying duty cycles

Zhongliang Zu(Vanderbilt University), Daniel F. Gochberg(Vanderbilt University), Xiao‐Yong Zhang(Fudan University), Moritz Zaiß(Friedrich-Alexander-Universität Erlangen-Nürnberg), Mark D. Does(Vanderbilt University), Ke Li(Central South University), John C. Gore(Vanderbilt University), Hua Li(University of Georgia), Junzhong Xu(Vanderbilt University)
Magnetic Resonance Imaging
May 17, 2017
Cited by 23


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