Resistive Random Access Memory for Future Information Processing System

Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), He Qian(University of Science and Technology of China), Zhichao Lu(University of Florida), Brent Haukness(Rambus (United States)), Xiao Hu Wang(Institute of Microelectronics), Bin Gao(Chinese Academy of Sciences), Gary Bronner(Rambus (United States)), Ning Deng(Fujitsu (China))
Proceedings of the IEEE
May 2, 2017
10.1109/jproc.2017.2684830
Cited by 116

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