Defects of clean graphene and sputtered graphite surfaces characterized by time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy

Wenjing Xie(Jiangsu University), Lu‐Tao Weng(University of Hong Kong), Chak K. Chan(City University of Hong Kong), Kai Mo Ng(Hong Kong University of Science and Technology)
Carbon
November 3, 2016
Cited by 73


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