Effect of electrode biasing on m/n = 2/1 tearing modes in J-TEXT experiments
Hai Liu, Zhongyong Chen(Huazhong University of Science and Technology), Qiming Hu(Princeton Plasma Physics Laboratory), Zhipeng Chen(Zhengzhou University), G. Zhuang(University of Science and Technology of China), Q. Yu(Max Planck Institute for Plasma Physics), Lizhi Zhu, Zhifeng Cheng(Huazhong University of Science and Technology)
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