Charging–discharging characteristics of a wound aluminum polymer capacitor

U-Seong Jeong(Ajou University), J.P. Hyung(Korea Testing Certification), Y.G. Yoon(Korea Testing Certification), Min Ji Ko(Korea Testing Certification), Sang-Hyub Ha, D.H. Lee, Hong-Liang Lim(Korea Testing Certification), Joong Soon Jang(Ajou University)
Microelectronics Reliability
September 1, 2016
Cited by 6

Abstract


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