Dielectric properties under high electric field for silicon doped alumina thin film with glass-like structure derived from sol-gel process
Manwen Yao(Tongji University), Xi Yao(Ministry of Education of the People's Republic of China), Jianwen Chen(Power Grid Corporation (India)), Qian Feng, Pei Zou(Tongji University), Fei Li(Jimei University), Zhen Su(South China University of Technology)
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