808 nm VCSELs Temperature Characteristic Study

Yuan Feng(Changchun University of Science and Technology), Yang Li(Henan Medical University), Yong Wang(Sinopec (China)), Pengcheng Liu(Guangdong Academy of Medical Sciences), Guojun Liu(Suzhou University of Science and Technology), Changling Yan(Changchun University of Science and Technology), Yongqin Hao(Changchun University of Science and Technology), Dawei Feng(University of Wisconsin–Madison), Xiaohui Ma(Changchun University of Science and Technology), Zaijin Li(Changchun University of Science and Technology)
Lecture notes in electrical engineering
October 28, 2015
10.1007/978-81-322-2580-5_72
Cited by 1

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