Breakdown Ruggedness of Quasi-Vertical GaN-Based p-i-n Diodes on Si Substrates

Kei May Lau(Hong Kong University of Science and Technology), Chak Wah Tang(Hong Kong University of Science and Technology), Xing Lü(Hong Kong University of Science and Technology), Xu Zhang(Hong Kong University of Science and Technology)
IEEE Electron Device Letters
July 27, 2016
Cited by 45


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