Combining the histogram method and the ultrafast segmented model identification of linearity errors algorithm for ADC linearity testing

Weida Chen(Shanghai Jiao Tong University), Dongyu Ou(Texas Instruments (United States)), Xinyang Li(Zhejiang University), Yongxin Zhu(Soochow University), Xinyi Liu(Shanghai Jiao Tong University)
Unknown
May 1, 2016
10.1109/ets.2016.7519298
Cited by 2

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