A highly reliable and tamper-resistant RRAM PUF: Design and experimental validation

Rui Liu(Arizona State University), Shimeng Yu(Georgia Institute of Technology), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Yachun Pang(Institute of Microelectronics), He Qian(University of Science and Technology of China)
Unknown
May 1, 2016
10.1109/hst.2016.7495549
Cited by 61

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