Numerical modeling of silicon photodiodes for high-accuracy applications, Part III: Interpolating and extrapolating internal quantum-efficiency calibrations

Jon Geist(National Institute of Standards and Technology), C. R. James(University of Alberta)
Journal of Research of the National Institute of Standards and Technology
July 1, 1991
10.6028/jres.096.025
Cited by 13

Related Papers

No related papers found

Powered by citation graph analysis