Non-Destructive PCB Reverse Engineering Using X-Ray Micro Computed Tomography

Navid Asadizanjani(University of Connecticut), Domenic Forte(University of Connecticut), Sina Shahbazmohamadi(University of Connecticut), Mark Tehranipoor(University of Connecticut)
Proceedings - International Symposium for Testing and Failure Analysis
November 1, 2015
Cited by 69


Related Papers

A Survey on Chip to System Reverse Engineering
|ACM Journal on Emerging Technologies in Computing Systems|2016|249
The Big Hack Explained
|ACM Journal on Emerging Technologies in Computing Systems|2020|99
Trojan Scanner: Detecting Hardware Trojans with Rapid SEM Imaging Combined with Image Processing and Machine Learning
|Proceedings - International Symposium for Testing and Failure Analysis|2018|73