Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests
Yijun Lü(Xiamen University), Zhong Chen(Xiamen University), Tien‐Mo Shih(Xiamen University), Hong-Li Lu(Xiamen University), Yue Lin(Xiamen University), Ziquan Guo(Xiamen University), Weilin Huang(Guangdong Academy of Sciences), Yulin Gao(Xiamen University)
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