Vertical 2D/3D Semiconductor Heterostructures Based on Epitaxial Molybdenum Disulfide and Gallium Nitride

Dmitry Ruzmetov(Material Measurement Laboratory), Kehao Zhang(Pennsylvania State University), Gheorghe Stan(National Institute of Standards and Technology), Berç Kalanyan(Material Measurement Laboratory), Ganesh R. Bhimanapati(Pennsylvania State University), Sarah M. Eichfeld(Pennsylvania State University), Robert A. Burke(DEVCOM Army Research Laboratory), Pankaj B. Shah(DEVCOM Army Research Laboratory), Terrance P. O’Regan(DEVCOM Army Research Laboratory), F. J. Crowne(DEVCOM Army Research Laboratory), A. Glen Birdwell(DEVCOM Army Research Laboratory), Joshua A. Robinson(Pennsylvania State University), Albert V. Davydov(National Institute of Standards and Technology), Tony Ivanov(DEVCOM Army Research Laboratory)
ACS Nano
February 11, 2016
Cited by 254

Abstract

When designing semiconductor heterostructures, it is expected that epitaxial alignment will facilitate low-defect interfaces and efficient vertical transport. Here, we report lattice-matched epitaxial growth of molybdenum disulfide (MoS2) directly on gallium nitride (GaN), resulting in high-quality, unstrained, single-layer MoS2 with strict registry to the GaN lattice. These results present a promising path toward the implementation of high-performance electronic devices based on 2D/3D vertical heterostructures, where each of the 3D and 2D semiconductors is both a template for subsequent epitaxial growth and an active component of the device. The MoS2 monolayer triangles average 1 μm along each side, with monolayer blankets (merged triangles) exhibiting properties similar to that of single-crystal MoS2 sheets. Photoluminescence, Raman, atomic force microscopy, and X-ray photoelectron spectroscopy analyses identified monolayer MoS2 with a prominent 20-fold enhancement of photoluminescence in the center regions of larger triangles. The MoS2/GaN structures are shown to electrically conduct in the out-of-plane direction, confirming the potential of directly synthesized 2D/3D semiconductor heterostructures for vertical current flow. Finally, we estimate a MoS2/GaN contact resistivity to be less than 4 Ω·cm(2) and current spreading in the MoS2 monolayer of approximately 1 μm in diameter.


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