Doppler and Opacity Effects in K-Shell X-Ray Sources on Z.

E. M. Waisman(Sandia National Laboratories), J. L. McKenney(Sandia National Laboratories), M. E. Cuneo(Sandia National Laboratories California), M. Krishnan(PSG INSTITUTE OF TECHNOLOGY AND APPLIED RESEARCH), A. Starobinets(Weizmann Institute of Science), J. W. Thornhill(United States Naval Research Laboratory), A. Bixler(University of California, Berkeley), G. A. Rochau(Sandia National Laboratories California), Christopher Jennings(Sandia National Laboratories California), A. Dasgupta(United States Naval Research Laboratory), James E. Bailey(University of Tennessee Health Science Center), G. S. Dunham(n&k Technology (United States)), Derek C. Lamppa(Sandia National Laboratories California), Y. Maron, D. J. Ampleford(Sandia National Laboratories), J. L. Giuliani(United States Naval Research Laboratory), Jeroen W. Thompson, P.L. Coleman, Stephanie B. Hansen(Sandia National Laboratories), V. Bernshtam(Weizmann Institute of Science), L. Weingarten(Weizmann Institute of Science), Drew Johnson(Sandia National Laboratories), T. Strizic(Sandia National Laboratories), A. L. Velikovich(United States Naval Research Laboratory), Michael E. Jones, Brent Manley Jones(Sandia National Laboratories), V. Fisher(Weizmann Institute of Science), Y. K. Chong(United States Naval Research Laboratory), Kristi Wilson Elliott(Alameda Applied Sciences Corporation (United States)), C. A. Coverdale(Sandia National Laboratories), R. Madden(Anthony Nolan), J. P. Apruzese(United States Naval Research Laboratory)
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
March 1, 2013
Cited by 0


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