Field-effect mobility of amorphous silicon thin-film transistors under strain

H. Glesková(Princeton University), S. Wagner(Princeton University), Zhigang Suo(Harvard University), P. I. Hsu(Princeton University), James C. Sturm(Princeton University), Z. C. Xi(University of Delaware)
Journal of Non-Crystalline Solids
May 29, 2004
10.1016/j.jnoncrysol.2004.03.079
Cited by 56

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