Effects of gate structures on the RF performance in PD SOI MOSFETs

Byung-Jin Lee(Incheon National University), Jong‐Tae Park(Flex (United States)), Chong-Gun Yu(Incheon National University), Jong‐Ho Lee(Seoul National University), Kyosun Kim(Incheon National University)
IEEE Microwave and Wireless Components Letters
April 1, 2005
Cited by 8


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