Modeling the gate bias dependence of contact resistance in staggered polycrystalline organic thin film transistors

Vincenzo Vinciguerra(STMicroelectronics (Switzerland)), Luigi G. Occhipinti(STMicroelectronics (Italy)), Donata Nicolosi(STMicroelectronics (Italy)), Manuela La Rosa(STMicroelectronics (Italy)), Giovanni Sicurella(STMicroelectronics (Italy))
Organic Electronics
May 28, 2009
Cited by 51


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