Quantitative Characterization of DNA Films by X-ray Photoelectron Spectroscopy

Dmitri Y. Petrovykh(National Institute of Standards and Technology), L. J. Whitman(Northwestern University), Michael J. Tarlov(National Institute of Standards and Technology), Hiromi Kimura(National Institute of Standards and Technology)
Langmuir
December 11, 2003
Cited by 193


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