Lateral Migration of Trapped Holes in a Nitride Storage Flash Memory Cell and Its Qualification Methodology

N. K. Zous(Macronix International (Taiwan)), C.-Y. Lu(Macronix International (Taiwan)), M.Y. Lee(Macronix International (Taiwan)), C.J. Liu(Macronix International (Taiwan)), Wen-Jer Tsai(National Yang Ming Chiao Tung University), J. Ku(Macronix International (Taiwan)), Tsung‐Chien Lu(Macronix International (Taiwan)), Albert Kuo(Macronix International (Taiwan)), T. Wang(National Yang Ming Chiao Tung University), Wei Lü(Dalian University of Technology), W. Ting(Macronix International (Taiwan)), L.T. Huang(Macronix International (Taiwan))
IEEE Electron Device Letters
August 31, 2004
Cited by 20


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