Optical and Structural Characterization of Erbium-Doped TiO[sub 2] Xerogel Films Processed on Porous Anodic Alumina
Н. В. Гапоненко(Belarusian State University of Informatics and Radioelectronics), G.E. Thompson(University of Manchester), Е. А. Степанова(Institute of General and Inorganic Chemistry of National Academy of Sciences of Belarus), Oleg Sergeev(Belarusian State University of Informatics and Radioelectronics), V. M. Parkun(Belarusian State University of Informatics and Radioelectronics), А. В. Мудрый(Belarusian State University of Informatics and Radioelectronics), J. Misiewicz(University of Wrocław), Hubert Gnaser(University of Kaiserslautern), L.J. Balk(Leibniz University Hannover), R. Heiderhoff(University of Wuppertal)
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