A geometric approach to modeling microstructurally small fatigue crack formation: II. Physically based modeling of microstructure-dependent slip localization and actuation of the crack nucleation mechanism in AA 7075-T651

Jacob Hochhalter(Langley Research Center), Antoinette M. Maniatty(Rensselaer Polytechnic Institute), Anthony R. Ingraffea(Cornell University), Michael Veilleux(Sandia National Laboratories), David John Littlewood(Sandia National Laboratories California), Robert J. Christ(Northrop Grumman (United States)), J. E. Bozek(Cornell University)
Modelling and Simulation in Materials Science and Engineering
March 11, 2010
Cited by 107


Related Papers