Reflectance confocal microscopy as a second‐level examination in skin oncology improves diagnostic accuracy and saves unnecessary excisions: a longitudinal prospective study
Giovanni Pellacani(Sapienza University of Rome), Caterina Longo(University of Modena and Reggio Emilia), Patrizia Pepe(University of Modena and Reggio Emilia), Alice Casari(Ospedale Santa Maria)
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