Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization. I. Fundamentals and theory

Paolo Bagnoli(University of Pisa), E. Dallago(University of Pavia), Mario Ciampi(AREA Science Park), Claudio Casarosa(University of Pisa)
IEEE Transactions on Power Electronics
November 1, 1998
10.1109/63.728348
Cited by 215

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