Study on Time Constants of Random Telegraph Noise in Gate Leakage Current Through Hot-Carrier Stress Test

Heung-Jae Cho(Seoul National University of Science and Technology), Hyungcheol Shin(University of California, Berkeley), Byung‐Gook Park(Seoul National University), Jongho Lee(Seoul National University), Younghwan Son(Seoul National University of Science and Technology), Sanghoon Lee(Yonsei University), Byoungchan Oh(Seoul National University of Science and Technology)
IEEE Electron Device Letters
July 26, 2010
10.1109/led.2010.2053694
Cited by 6

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