Random Circuit Breaker Network Model for Unipolar Resistance Switching

Seung Chul Chae(Seoul National University), Jae Sung Lee(Seoul National University), Se‐Jin Kim(Kookmin University), Shinbuhm Lee(Seoul National University), Seo Hyoung Chang(Seoul National University), Chun-Li Liu(Seoul National University), B. Kahng(Seoul National University), Hyunjung Shin(Kookmin University), Dongwook Kim(Hanyang University), C. U. Jung(Hankuk University of Foreign Studies), Sunae Seo(Ewha Womans University), Myoung‐Jae Lee(Samsung (South Korea)), Tae Won Noh(Seoul National University)
Advanced Materials
March 7, 2008
Cited by 347

Abstract

The random circuit breaker network model is proposed for unipolar resistance switching behavior. This model describes reversible dynamic processes involving two quasi-metastable states. The formation and rupture of conducting channels (see figure) in the polycrystalline TiO2 thin films may be analyzed by the self organized avalanche process in the random circuit breaker network model. Supporting information for this article is available on the WWW under http://www.wiley-vch.de/contents/jc_2089/2008/adma200702024_s.pdf or from the author. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.


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