Image based compensation for thickness variation in microscopy section series

Philipp Hanslovsky(Janelia Research Campus), Stephan Saalfeld(Janelia Research Campus), Zhiyuan Lu(Dalhousie University), C. Shan Xu(Howard Hughes Medical Institute), John Bogovic(Howard Hughes Medical Institute), Harald F. Hess(Janelia Research Campus), Kenneth J. Hayworth(Harvard University)
arXiv (Cornell University)
November 3, 2015
Cited by 0


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