A FULLY BAYESIAN METHOD FOR JOINTLY FITTING INSTRUMENTAL CALIBRATION AND X-RAY SPECTRAL MODELS

Xu Jin(University of California, Irvine), Yaming Yu(University of California, Irvine), Aneta Siemiginowska(Center for Astrophysics Harvard & Smithsonian), David A. van Dyk(Harvard University Press), V. Kashyap(Center for Astrophysics Harvard & Smithsonian), Pete Ratzlaff(Smithsonian Astrophysical Observatory), Xiao‐Li Meng(Harvard University), A. Connors(Eureka Scientific), J. J. Drake(Lockheed Martin (United States))
The Astrophysical Journal
September 26, 2014
10.1088/0004-637x/794/2/97
Cited by 31

Related Papers

Statistics, Handle with Care: Detecting Multiple Model Components with the Likelihood Ratio Test
|The Astrophysical Journal|2002|696
A Wavelet-Based Algorithm for the Spatial Analysis of Poisson Data
|Unknown|2001|353
Ten Simple Rules for the Care and Feeding of Scientific Data
|PLoS Computational Biology|2014|240
Extreme‐Ultraviolet Flare Activity in Late‐Type Stars
|The Astrophysical Journal|2000|233
Is RX J1856.5−3754 a Quark Star?
|The Astrophysical Journal|2002|229