Transient leakage current technique for MIS HEMT (Al2O3/AlGaN/GaN) dielectric semiconductor interface property characterization
Cheng P. Wen(Peking University), Chak Wah Tang(Hong Kong University of Science and Technology), Kei May Lau(Hong Kong University of Science and Technology), Hongwei Chen(Liaoning Shihua University), Yilong Hao(Peking University), Jinyan Wang(Peking University)
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